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Micron (Oxford, England : 1993)|March 24, 2006
Electron-irradiation damage in chromium nitrides and chromium oxynitride thin filmsChristoph Mitterbauer, Werner Grogger, Peter Wilhartitz, et al.
Analytical and Bioanalytical Chemistry|January 30, 2004
Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDsSabine Dreer, Peter Wilhartitz, Kurt Piplits, et al.
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