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Peter Z Takacs

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The Review of Scientific Instruments|April 2, 2026
Improvements in optical metrology for high-performance variable-line-spacing x-ray gratingsValeriy V Yashchuk, Peter Z Takacs, Ian Lacey, et al.
Applied Optics|August 12, 2025
Topography restoration in white-light interferometry using an instrument transfer function evaluated with binary pseudo-random arraysShigenobu Hirose, Peter Z Takacs, Valeriy V Yashchuk, et al.
Journal of Synchrotron Radiation|October 15, 2011
Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-IIMarcelo G Honnicke, Jeffrey W Keister, Raymond Conley, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|April 2, 2026
Improvements in optical metrology for high-performance variable-line-spacing x-ray gratingsValeriy V Yashchuk, Peter Z Takacs, Ian Lacey, et al.
Applied Optics|August 12, 2025
Topography restoration in white-light interferometry using an instrument transfer function evaluated with binary pseudo-random arraysShigenobu Hirose, Peter Z Takacs, Valeriy V Yashchuk, et al.
Journal of Synchrotron Radiation|October 15, 2011
Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-IIMarcelo G Honnicke, Jeffrey W Keister, Raymond Conley, et al.
Pageof 1