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Plos One|March 16, 2019
Automated multi-sample acquisition and analysis using atomic force microscopy for biomedical applicationsAntoine Dujardin, Peter De Wolf, Frank Lafont, et al.
The International Journal of Health Planning and Management|December 13, 2005
Regulating the Dutch pharmaceutical market: improving efficiency or controlling costs?Peter de Wolf, Werner B F Brouwer, Frans F H Rutten
Beilstein Journal of Nanotechnology|December 10, 2020
Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopyRosine Coq Germanicus, Peter De Wolf, Florent Lallemand, et al.
ACS Applied Materials & Interfaces|March 10, 2022
Controlled Porosity in Ferroelectric BaTiO3 PhotoanodesAdriana Augurio, Alberto Alvarez-Fernandez, Vishal Panchal, et al.
Analytical Chemistry|November 1, 2024
Photothermal AFM-IR Depth Sensitivity: An Original Pathway to Tomographic ReconstructionAlexandre Dazzi, Jeremie Mathurin, Philippe Leclere, et al.
The Journal of Physical Chemistry Letters|March 27, 2025
Chemical Mapping of Supramolecular Self-Assembled Monolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-Scale Lateral ResolutionAlexandre Dazzi, Frank Palmino, Ariane Deniset-Besseau, et al.
Nanotechnology|February 20, 2019
Probing electromechanical behaviors by datacube piezoresponse force microscopy in ambient and aqueous environmentsAnyang Cui, Peter De Wolf, Yan Ye, et al.
ACS Nano|May 12, 2025
Force Volume Atomic Force Microscopy-Infrared for Simultaneous Nanoscale Chemical and Mechanical SpectromicroscopyMartin Wagner, Qichi Hu, Shuiqing Hu, et al.
Scientific Reports|February 2, 2019
Advanced measurement and diagnosis of the effect on the underlayer roughness for industrial standard metrologyJung-Hwan Kim, Seunghyun Moon, Ji-Woong Kim, et al.
Nanoscale|February 17, 2021
Fabrication of plasmonic arrays of nanodisks and nanotriangles by nanotip indentation lithography and their optical propertiesJongwoo Kim, Jeong Seop Lee, Ji-Woong Kim, et al.
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