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Nanoscale|November 22, 2014
Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensorsHuchuan Zhou, Piotr Kropelnicki, Chengkuo Lee
The Review of Scientific Instruments|May 2, 2016
Parasitic analysis and π-type Butterworth-Van Dyke model for complementary-metal-oxide-semiconductor Lamb wave resonator with accurate two-port Y-parameter characterizationsYong Wang, Wang Ling Goh, Kevin T-C Chai, et al.
Optics Letters|June 16, 2015
Two-dimensional photonic-crystal-based Fabry-Perot etalonChong Pei Ho, Prakash Pitchappa, Piotr Kropelnicki, et al.
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