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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
A Comprehensive Analysis of Combined AFM/SEM Systems for In-Situ Nanoscale Characterizations and Multiparametric Correlative MicroscopyPrabhu Prasad Swain, Marcos Penedo, Georg Ernest FantnerJournal of Structural Biology|June 2, 2023
Correlating cryo-super resolution radial fluctuations and dual-axis cryo-scanning transmission electron tomography to bridge the light-electron resolution gapPeter Kirchweger, Debakshi Mullick, Prabhu Prasad Swain, et al.Pageof 1