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Optics Express|December 23, 2022
Refurbishment of W/B4C multilayers on Si substrate by etching a chromium buffer layerQingyan Hou, Ming Li, Rongli Cui, et al.
Applied Optics|June 10, 2024
Preparation and measurement of an x-ray Laue-type monochromator based on a WSi2/Si multilayerShuaipeng Yue, Qingyan Hou, Bin Ji, et al.
Journal of Synchrotron Radiation|July 29, 2024
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurementsFang Liu, Ming Li, Qianshun Diao, et al.
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