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The Review of Scientific Instruments|September 8, 2011
Dynamic junction temperature measurement for high power light emitting diodesQuan Chen, Xiaobing Luo, Shengjun Zhou, et al.
The Review of Scientific Instruments|October 2, 2009
Transient measurement of light-emitting diode characteristic parameters for production linesShengjun Zhou, Sheng Liu
The Review of Scientific Instruments|October 3, 2014
Note: An online testing method for lifetime projection of high power light-emitting diode under accelerated reliability testQi Chen, Quan Chen, Xiaobing Luo
Optics Express|July 1, 2010
Precise optical modeling of blue light-emitting diodes by Monte Carlo ray-tracingZongyuan Liu, Kai Wang, Xiaobing Luo, et al.
Optics Express|February 23, 2010
Design of compact freeform lens for application specific Light-Emitting Diode packagingKai Wang, Fei Chen, Zongyuan Liu, et al.
Optics Express|April 1, 2009
Effect of manufacturing defects on optical performance of discontinuous freeform lensesKai Wang, Sheng Liu, Fei Chen, et al.
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