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R Aveyard

Showing results (1-10 of 3) with videos related to

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Ultramicroscopy|September 23, 2016
Tilt series STEM simulation of a 25×25×25nm semiconductor with characteristic X-ray emissionR Aveyard, B Rieger
Ultramicroscopy|March 18, 2017
Optimizing experimental parameters for the projection requirement in HAADF-STEM tomographyR Aveyard, Z Zhong, K J Batenburg, et al.
Physical Review Letters|June 13, 2002
Measurement of long-range repulsive forces between charged particles at an oil-water interfaceR Aveyard, B P Binks, J H Clint, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 23, 2016
Tilt series STEM simulation of a 25×25×25nm semiconductor with characteristic X-ray emissionR Aveyard, B Rieger
Ultramicroscopy|March 18, 2017
Optimizing experimental parameters for the projection requirement in HAADF-STEM tomographyR Aveyard, Z Zhong, K J Batenburg, et al.
Physical Review Letters|June 13, 2002
Measurement of long-range repulsive forces between charged particles at an oil-water interfaceR Aveyard, B P Binks, J H Clint, et al.
Pageof 1