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R Fortunier

Showing results (1-10 of 3) with videos related to

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Journal of Microscopy|May 28, 2008
A 3D Hough transform for indexing EBSD and Kossel patternsC Maurice, R Fortunier
Journal of Microscopy|February 18, 2009
Accuracy assessment of elastic strain measurement by EBSDS Villert, C Maurice, C Wyon, et al.
Ultramicroscopy|October 5, 2010
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patternsT B Britton, C Maurice, R Fortunier, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|May 28, 2008
A 3D Hough transform for indexing EBSD and Kossel patternsC Maurice, R Fortunier
Journal of Microscopy|February 18, 2009
Accuracy assessment of elastic strain measurement by EBSDS Villert, C Maurice, C Wyon, et al.
Ultramicroscopy|October 5, 2010
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patternsT B Britton, C Maurice, R Fortunier, et al.
Pageof 1