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R G Saint-Jacques

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Journal of Electron Microscopy Technique|October 1, 1989
Systematic procedure for indexing HOLZ lines in convergent beam electron diffraction patterns of cubic crystalD Fournier, G L'Esperance, R G Saint-Jacques
Ultramicroscopy|December 1, 2009
Characterization of Si nanocrystals by different TEM-based techniquesL Nikolova, R G Saint-Jacques, G G Ross
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Journal of Electron Microscopy Technique|October 1, 1989
Systematic procedure for indexing HOLZ lines in convergent beam electron diffraction patterns of cubic crystalD Fournier, G L'Esperance, R G Saint-Jacques
Ultramicroscopy|December 1, 2009
Characterization of Si nanocrystals by different TEM-based techniquesL Nikolova, R G Saint-Jacques, G G Ross
Pageof 1