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Applied Optics|February 20, 2010
Statistical analysis of defect-caused laser damage in thin filmsR H Picard, D Milam, R A BradburyOptics Letters|August 25, 2009
Ultrahigh-resolution spectroscopy and frequency standards in the microwave and far-infrared regions using optical lasersJ E Thomas, S Ezekiel, C C Leiby, et al.Pageof 1