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Molecular Systems Design & Engineering
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June 13, 2018
Optimizing self-consistent field theory block copolymer models with X-ray metrology
Adam F Hannon, Daniel F Sunday, Alec Bowen, et al.
ACS Applied Materials & Interfaces
|
November 11, 2015
Oriented Liquid Crystalline Polymer Semiconductor Films with Large Ordered Domains
Xiao Xue, George Chandler, Xinran Zhang, et al.
Chemical Communications (Cambridge, England)
|
February 10, 2012
Germaindacenodithiophene based low band gap polymers for organic solar cells
Zhuping Fei, Raja Shahid Ashraf, Zhenggang Huang, et al.
ACS Nano
|
July 31, 2014
Determination of the internal morphology of nanostructures patterned by directed self assembly
Daniel F Sunday, Matthew R Hammond, Chengqing Wang, et al.
Journal of the American Chemical Society
|
March 1, 2012
Three-dimensional packing structure and electronic properties of biaxially oriented poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) films
Eunkyung Cho, Chad Risko, Dongwook Kim, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
January 26, 2021
A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II
Eliot Gann, Thomas Crofts, Glenn Holland, et al.
Science Advances
|
April 8, 2020
Soft crystal martensites: An in situ resonant soft x-ray scattering study of a liquid crystal martensitic transformation
Hyeong Min Jin, Xiao Li, James A Dolan, et al.
ACS Nano
|
November 18, 2010
Correlations between mechanical and electrical properties of polythiophenes
Brendan O'Connor, Edwin P Chan, Calvin Chan, et al.
ACS Nano
|
March 26, 2009
Controlling the orientation of terraced nanoscale "ribbons" of a poly(thiophene) semiconductor
Dean M DeLongchamp, R Joseph Kline, Youngsuk Jung, et al.
Chemistry of Materials : a Publication of the American Chemical Society
|
October 26, 2020
The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography
Daniel F Sunday, Xuanxuan Chen, Thomas R Albrecht, et al.
Page
of 5
Search research articles
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Showing results (21-30 of 42) with videos related to
Sort By:
Page
of 5
Molecular Systems Design & Engineering
|
June 13, 2018
Optimizing self-consistent field theory block copolymer models with X-ray metrology
Adam F Hannon, Daniel F Sunday, Alec Bowen, et al.
ACS Applied Materials & Interfaces
|
November 11, 2015
Oriented Liquid Crystalline Polymer Semiconductor Films with Large Ordered Domains
Xiao Xue, George Chandler, Xinran Zhang, et al.
Chemical Communications (Cambridge, England)
|
February 10, 2012
Germaindacenodithiophene based low band gap polymers for organic solar cells
Zhuping Fei, Raja Shahid Ashraf, Zhenggang Huang, et al.
ACS Nano
|
July 31, 2014
Determination of the internal morphology of nanostructures patterned by directed self assembly
Daniel F Sunday, Matthew R Hammond, Chengqing Wang, et al.
Journal of the American Chemical Society
|
March 1, 2012
Three-dimensional packing structure and electronic properties of biaxially oriented poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) films
Eunkyung Cho, Chad Risko, Dongwook Kim, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
January 26, 2021
A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II
Eliot Gann, Thomas Crofts, Glenn Holland, et al.
Science Advances
|
April 8, 2020
Soft crystal martensites: An in situ resonant soft x-ray scattering study of a liquid crystal martensitic transformation
Hyeong Min Jin, Xiao Li, James A Dolan, et al.
ACS Nano
|
November 18, 2010
Correlations between mechanical and electrical properties of polythiophenes
Brendan O'Connor, Edwin P Chan, Calvin Chan, et al.
ACS Nano
|
March 26, 2009
Controlling the orientation of terraced nanoscale "ribbons" of a poly(thiophene) semiconductor
Dean M DeLongchamp, R Joseph Kline, Youngsuk Jung, et al.
Chemistry of Materials : a Publication of the American Chemical Society
|
October 26, 2020
The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography
Daniel F Sunday, Xuanxuan Chen, Thomas R Albrecht, et al.
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of 5