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Applied Optics|March 8, 2008
Spectroscopic generalized ellipsometry based on fourier analysisA En Naciri, L Johann, R KleimApplied Optics|March 25, 2008
Surface Effects of the HgI(2) Crystal Characterized by Spectroscopic EllipsometryA En Naciri, L Johann, R Kleim, et al.Applied Optics|February 29, 2008
Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2A En Naciri, L Johann, R Kleim, et al.Pageof 1