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The Review of Scientific Instruments|March 1, 1979
Soft x-ray appearance potential spectroscopy with a channelplate detectorR S Withers, R N Lee
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Two-dimensional critical point configuration graphsR N Lee
Physical Review Letters|August 11, 2001
Relativistic corrections to the electric polarizability of compound systemsR N Lee, A I Milstein, M Schumacher
Molecular Ecology|May 12, 2001
Founder effect in an island population of bighorn sheepP W Hedrick, G A Gutierrez-Espeleta, R N Lee
Forensic Science International|February 20, 2002
Blind field test evaluation of Raman spectroscopy as a forensic toolS D Harvey, M E Vucelick, R N Lee, et al.
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