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IEEE Transactions on Pattern Analysis and Machine Intelligence
|
March 8, 2005
Adaptively merging large-scale range data with reflectance properties
R Sagawa, K Nishino, K Ikeuchi
Microscopy (Oxford, England)
|
October 13, 2020
Improving the depth resolution of STEM-ADF sectioning by 3D deconvolution
A Ishizuka, K Ishizuka, R Ishikawa, et al.
Inflammopharmacology
|
April 24, 2007
A diagnosis support system for capsule endoscopy
Y Yagi, H Vu, T Echigo, et al.
Nature Communications
|
August 27, 2016
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
H Yang, R N Rutte, L Jones, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
March 8, 2005
Adaptively merging large-scale range data with reflectance properties
R Sagawa, K Nishino, K Ikeuchi
Microscopy (Oxford, England)
|
October 13, 2020
Improving the depth resolution of STEM-ADF sectioning by 3D deconvolution
A Ishizuka, K Ishizuka, R Ishikawa, et al.
Inflammopharmacology
|
April 24, 2007
A diagnosis support system for capsule endoscopy
Y Yagi, H Vu, T Echigo, et al.
Nature Communications
|
August 27, 2016
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
H Yang, R N Rutte, L Jones, et al.
Page
of 1