Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

R W Odom

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Analytical Chemistry|May 31, 2011
Matrix-enhanced secondary ion mass spectrometry:  a method for molecular analysis of solid surfacesK J Wu, R W Odom
Analytical Chemistry|July 17, 1998
Characterizing synthetic polymers by MALDI MSK J Wu, R W Odom
Analytical Chemistry|November 1, 1995
XPS and TOF-SIMS microanalysis of a peptide/polymer drug delivery deviceC M John, R W Odom, L Salvati, et al.
Analytical Chemistry|October 1, 1988
Quantitative trace element analysis of microdroplet residues by secondary ion mass spectrometryR W Odom, G Lux, R H Fleming, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Analytical Chemistry|May 31, 2011
Matrix-enhanced secondary ion mass spectrometry:  a method for molecular analysis of solid surfacesK J Wu, R W Odom
Analytical Chemistry|July 17, 1998
Characterizing synthetic polymers by MALDI MSK J Wu, R W Odom
Analytical Chemistry|November 1, 1995
XPS and TOF-SIMS microanalysis of a peptide/polymer drug delivery deviceC M John, R W Odom, L Salvati, et al.
Analytical Chemistry|October 1, 1988
Quantitative trace element analysis of microdroplet residues by secondary ion mass spectrometryR W Odom, G Lux, R H Fleming, et al.
Pageof 1