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Ultramicroscopy|March 30, 2019
Tip wear and tip breakage in high-speed atomic force microscopesTimo Strahlendorff, Gaoliang Dai, Detlef Bergmann, et al.
Sensors (Basel, Switzerland)|January 11, 2022
True 3D Nanometrology: 3D-Probing with a Cantilever-Based SensorJan Thiesler, Thomas Ahbe, Rainer Tutsch, et al.
Applied Optics|December 24, 2011
Random-phase-shift Fizeau interferometerHagen Broistedt, Nicolae Radu Doloca, Sebastian Strube, et al.
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