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IEEE Transactions on Pattern Analysis and Machine Intelligence|July 11, 2018
Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context ReductionRalf Schluter, Eugen Beck, Hermann Ney
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 15, 2007
Deformation models for image recognitionDaniel Keysers, Thomas Deselaers, Christian Gollan, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 9, 2011
Latent log-linear models for handwritten digit classificationThomas Deselaers, Tobias Gass, Georg Heigold, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 17, 2011
Does the cost function matter in Bayes decision rule?Ralf Schlü ter, Markus Nussbaum-Thom, Hermann Ney
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 21, 2004
Adaptation in statistical pattern recognition using tangent vectorsDaniel Keysers, Wolfgang Macherey, Hermann Ney, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|April 17, 2019
Weakly Supervised Learning with Multi-Stream CNN-LSTM-HMMs to Discover Sequential Parallelism in Sign Language VideosOscar Koller, Necati Cihan Camgoz, Hermann Ney, et al.
Computerized Medical Imaging and Graphics : the Official Journal of the Computerized Medical Imaging Society|March 10, 2005
Automatic categorization of medical images for content-based retrieval and data miningThomas M Lehmann, Mark O Güld, Thomas Deselaers, et al.
Journal of Digital Imaging|May 15, 2007
Extended query refinement for medical image retrievalThomas M Deserno, Mark O Güld, Bartosz Plodowski, et al.
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