Showing results (1-10 of 12) with videos related to
Sort By:
Pageof 2
Journal of Research of the National Institute of Standards and Technology|March 19, 2016
New Measurement Service for Determining Pressure Sensitivity of Type LS2aP Microphones by the Reciprocity MethodRandall P Wagner, Victor Nedzelnitsky, Steven E FickJournal of Research of the National Institute of Standards and Technology|April 21, 2016
Non-Contact Methods for Measuring Front Cavity Depths of Laboratory Standard Microphones Using a Depth-Measuring MicroscopeVictor Nedzelnitsky, Randall P WagnerJournal of Research of the National Institute of Standards and Technology|April 26, 2016
Effect of Power Line Interference on Microphone Calibration Measurements Made at or Near Harmonics of the Power Line FrequencyRandall P Wagner, Victor NedzelnitskyThe Journal of the Acoustical Society of America|October 2, 2017
Pressure reciprocity calibration of a MEMS microphoneRandall P Wagner, Steven E FickJournal of Research of the National Institute of Standards and Technology|April 21, 2016
Long-Term Stability of the NIST Standard Ultrasonic SourceSteven E FickJournal of Research of the National Institute of Standards and Technology|June 9, 2016
In-situ Attenuation Corrections for Radiation Force Measurements of High Frequency Ultrasound With a Conical TargetSteven E Fick, Dorea RugglesJournal of Research of the National Institute of Standards and Technology|September 25, 2015
NIST System for Measuring the Directivity Index of Hearing Aids under Simulated Real-Ear ConditionsRandall P WagnerJournal of Research of the National Institute of Standards and Technology|March 19, 2016
Long-Term Stability of the NIST Conical Reference TransducerSteven E Fick, Thomas M ProctorJournal of Research of the National Institute of Standards and Technology|January 1, 1996
Ultrasonic Power Output Measurement by Pulsed Radiation PressureSteven E Fick, Franklin R BreckenridgeJournal of Research of the National Institute of Standards and Technology|March 10, 2016
Long-Term Stability of One-Inch Condenser Microphones Calibrated at the National Institute of Standards and TechnologyRandall P Wagner, William F GuthriePageof 2