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Ultramicroscopy|October 22, 2013
3D spatial resolution improvement by dual-axis electron tomography: application to tri-gate transistorsGeorg Haberfehlner, Raphaël Serra, David Cooper, et al.
Nano Letters|April 13, 2026
Leakage-Induced Space-Charge Accumulation and Interfacial Field Redistribution in a Dielectric Nanocapacitor Revealed by Operando Electron HolographyBérangère Disic, Kilian Gruel, Aurélien Masseboeuf, et al.
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