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Analytical and Bioanalytical Chemistry|January 12, 2010
Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOESRamón Escobar Galindo, Raul Gago, David Duday, et al.Journal of Synchrotron Radiation|June 17, 2008
Versatile vacuum chamber for in situ surface X-ray scattering studiesDina Carbone, Olivier Plantevin, Raul Gago, et al.Pageof 1