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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 8, 2020
Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in ConnectomicsPavel Potocek, Patrick Trampert, Maurice Peemen, et al.Ultramicroscopy|December 27, 2016
A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEMZhichao Zhong, Bart Goris, Remco Schoenmakers, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applicationsChristian Kübel, Andreas Voigt, Remco Schoenmakers, et al.Biorxiv : the Preprint Server for Biology|June 25, 2024
SmartEM: machine-learning guided electron microscopyYaron Meirovitch, Core Francisco Park, Lu Mi, et al.Nature Methods|December 30, 2025
SmartEM: machine learning-guided electron microscopyYaron Meirovitch, Ishaan Singh Chandok, Core Francisco Park, et al.Pageof 1