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Ren-Jie Chan

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Applied Microscopy|February 13, 2021

Sequential conversion from line defects to atomic clusters in monolayer WS<sub>2</sub>Gyeong Hee Ryu, Ren-Jie Chan

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Search research articles

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Applied Microscopy|February 13, 2021

Sequential conversion from line defects to atomic clusters in monolayer WS<sub>2</sub>Gyeong Hee Ryu, Ren-Jie Chan

Pageof 1