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Renhui Guo

Showing results (1-10 of 7) with videos related to

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Applied Optics|September 11, 2019
Least-squares calibration method for double-grating interferometers used in measurement of long-focal-length lensesYong He, Lei Chen, Yao Liu, et al.
Applied Optics|October 20, 2017
Dynamic wavefront measurement with a pinhole linear polarizer point-diffraction interferometerXiang Zhou, Renhui Guo, Wenhua Zhu, et al.
Applied Optics|February 24, 2022
Dynamic wavefront measurement with a point diffraction interferometer based on birefringence polarization beam splittingXin Yang, Renhui Guo, Xing Tang, et al.
Optics Letters|December 1, 2021
Dynamic white-light interferometry via multiwavelength tilt iteration and sliding local least squaresMingliang Duan, Jianxin Li, Shuxian Bi, et al.
Optics Express|May 5, 2019
Optical homogeneity measurement of parallel plates by wavelength-tuning interferometry using nonuniform fast Fourier transformRenhui Guo, Zhishan Liao, Jianxin Li, et al.
Optics Express|October 7, 2021
Surface defect measurement of ICF capsules under a limited depth of fieldRenhui Guo, Zhiyao Yin, Hang Fu, et al.
Optics Letters|November 2, 2018
Null interferometric microscope for ICF-capsule surface-defect detectionCong Wei, Jun Ma, Lei Chen, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|September 11, 2019
Least-squares calibration method for double-grating interferometers used in measurement of long-focal-length lensesYong He, Lei Chen, Yao Liu, et al.
Applied Optics|October 20, 2017
Dynamic wavefront measurement with a pinhole linear polarizer point-diffraction interferometerXiang Zhou, Renhui Guo, Wenhua Zhu, et al.
Applied Optics|February 24, 2022
Dynamic wavefront measurement with a point diffraction interferometer based on birefringence polarization beam splittingXin Yang, Renhui Guo, Xing Tang, et al.
Optics Letters|December 1, 2021
Dynamic white-light interferometry via multiwavelength tilt iteration and sliding local least squaresMingliang Duan, Jianxin Li, Shuxian Bi, et al.
Optics Express|May 5, 2019
Optical homogeneity measurement of parallel plates by wavelength-tuning interferometry using nonuniform fast Fourier transformRenhui Guo, Zhishan Liao, Jianxin Li, et al.
Optics Express|October 7, 2021
Surface defect measurement of ICF capsules under a limited depth of fieldRenhui Guo, Zhiyao Yin, Hang Fu, et al.
Optics Letters|November 2, 2018
Null interferometric microscope for ICF-capsule surface-defect detectionCong Wei, Jun Ma, Lei Chen, et al.
Pageof 1