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Journal of Electronic Materials|June 10, 2025
A Novel Approach for Analysis of Rocking Curve X-Ray Diffraction Imaging Data (RC-XRDI) on 4H-SiC Using Cumulative Integrated Intensity (CII) MethodArash Estiri, Richard Bytheway, Tamzin Amanda Lafford, et al.
Analytical Chemistry|October 15, 2005
Enhancing the signal-to-noise ratio of X-ray diffraction profiles by smoothed principal component analysisZeng Ping Chen, Julian Morris, Elaine Martin, et al.
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