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Richard K Leach

Showing results (1-10 of 9) with videos related to

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Optics Express|March 2, 2023
Improving the localisation of features for the calibration of cameras using EfficientNetsJoe Eastwood, George Gayton, Richard K Leach, et al.
Applied Optics|July 14, 2016
Quadrature wavelength scanning interferometryGiuseppe Moschetti, Alistair Forbes, Richard K Leach, et al.
Optics Express|May 4, 2016
Phase and fringe order determination in wavelength scanning interferometryGiuseppe Moschetti, Alistair Forbes, Richard K Leach, et al.
Micron (Oxford, England : 1993)|July 22, 2014
New method development in prehistoric stone tool research: evaluating use duration and data analysis protocolsAdrian A Evans, Danielle A Macdonald, Claudiu L Giusca, et al.
Applied Optics|November 13, 2015
Model-based defect detection on structured surfaces having optically unresolved featuresDaniel O'Connor, Andrew J Henning, Ben Sherlock, et al.
Proceedings. Mathematical, Physical, and Engineering Sciences|August 6, 2016
Loose powder detection and surface characterization in selective laser sintering via optical coherence tomographyGuangying Guan, Matthias Hirsch, Wahyudin P Syam, et al.
ACS Applied Materials & Interfaces|January 18, 2017
Combined Inkjet Printing and Infrared Sintering of Silver Nanoparticles using a Swathe-by-Swathe and Layer-by-Layer Approach for 3-Dimensional StructuresJayasheelan Vaithilingam, Marco Simonelli, Ehab Saleh, et al.
Optics Letters|April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurementDavid P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Nanotechnology|January 8, 2011
The European nanometrology landscapeRichard K Leach, Robert Boyd, Theresa Burke, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Optics Express|March 2, 2023
Improving the localisation of features for the calibration of cameras using EfficientNetsJoe Eastwood, George Gayton, Richard K Leach, et al.
Applied Optics|July 14, 2016
Quadrature wavelength scanning interferometryGiuseppe Moschetti, Alistair Forbes, Richard K Leach, et al.
Optics Express|May 4, 2016
Phase and fringe order determination in wavelength scanning interferometryGiuseppe Moschetti, Alistair Forbes, Richard K Leach, et al.
Micron (Oxford, England : 1993)|July 22, 2014
New method development in prehistoric stone tool research: evaluating use duration and data analysis protocolsAdrian A Evans, Danielle A Macdonald, Claudiu L Giusca, et al.
Applied Optics|November 13, 2015
Model-based defect detection on structured surfaces having optically unresolved featuresDaniel O'Connor, Andrew J Henning, Ben Sherlock, et al.
Proceedings. Mathematical, Physical, and Engineering Sciences|August 6, 2016
Loose powder detection and surface characterization in selective laser sintering via optical coherence tomographyGuangying Guan, Matthias Hirsch, Wahyudin P Syam, et al.
ACS Applied Materials & Interfaces|January 18, 2017
Combined Inkjet Printing and Infrared Sintering of Silver Nanoparticles using a Swathe-by-Swathe and Layer-by-Layer Approach for 3-Dimensional StructuresJayasheelan Vaithilingam, Marco Simonelli, Ehab Saleh, et al.
Optics Letters|April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurementDavid P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Nanotechnology|January 8, 2011
The European nanometrology landscapeRichard K Leach, Robert Boyd, Theresa Burke, et al.
Pageof 1