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Rikuto Nakama

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Scientific Reports|October 27, 2021
Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filteringYifang Zhao, Suguru Koike, Rikuto Nakama, et al.
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Scientific Reports|October 27, 2021
Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filteringYifang Zhao, Suguru Koike, Rikuto Nakama, et al.
Pageof 1