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Proceedings of Spie--The International Society for Optical Engineering|April 20, 2019
Selective removal of dental calculus with a diode-pumped Er:YAG laserWilliam A Fried, Kenneth H Chan, Cynthia L Darling, et al.
Proceedings of Spie--The International Society for Optical Engineering|September 28, 2011
Near-IR imaging of Erbium Laser Ablation with a Water SprayCynthia L Darling, Marie E Maffei, William A Fried, et al.
Proceedings of Spie--The International Society for Optical Engineering|December 21, 2013
Imaging Early Demineralization on Tooth Occlusal Surfaces with a High Definition InGaAs CameraWilliam A Fried, Daniel Fried, Kenneth H Chan, et al.
Lasers in Surgery and Medicine|December 31, 2013
Multispectral near-IR reflectance imaging of simulated early occlusal lesions: variation of lesion contrast with lesion depth and severityJacob C Simon, Kenneth H Chan, Cynthia L Darling, et al.
Proceedings of Spie--The International Society for Optical Engineering|January 28, 2014
Methods for Monitoring Erosion Using Optical Coherence TomographyKenneth H Chan, Andrew C Chan, Cynthia L Darling, et al.
The Oncologist|August 2, 2006
Combined modality therapy for stage III non-small cell lung cancerThomas E Stinchcombe, Daniel Fried, David E Morris, et al.
Lasers in Surgery and Medicine|October 18, 2006
Dissolution studies of bovine dental enamel surfaces modified by high-speed scanning ablation with a lambda = 9.3-microm TEA CO(2) laserDaniel Fried, John D B Featherstone, Charles Q Le, et al.
Proceedings of Spie--The International Society for Optical Engineering|April 29, 2017
Optical changes of dentin in the near-IR as a function of mineral contentRhett A Berg, Jacob C Simon, Daniel Fried, et al.
Dental Clinics of North America|June 16, 2018
Optical Coherence TomographyRujuta A Katkar, Satyashankara Aditya Tadinada, Bennett T Amaechi, et al.
Proceedings of Spie--The International Society for Optical Engineering|March 22, 2016
Influence of stains on lesion contrast in the pits and fissures of tooth occlusal surfaces from 800-1600-nmElias C Almaz, Jacob C Simon, Daniel Fried, et al.
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