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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2006
Quantitative thin-film x-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determinationAldo Armigliato, Roberto Balboni, Rodolfo Rosa
Ultramicroscopy|May 21, 2016
Generation and application of bessel beams in electron microscopyVincenzo Grillo, Jérémie Harris, Gian Carlo Gazzadi, et al.
Optics Express|October 19, 2017
Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopyVincenzo Grillo, Amir H Tavabi, Emrah Yucelen, et al.
Nature Communications|September 27, 2017
Observation of nanoscale magnetic fields using twisted electron beamsVincenzo Grillo, Tyler R Harvey, Federico Venturi, et al.
Nature Communications|May 25, 2017
Measuring the orbital angular momentum spectrum of an electron beamVincenzo Grillo, Amir H Tavabi, Federico Venturi, et al.
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