Search research articles
Contact Us
Filters
Showing results (1-10 of 5) with videos related to
Page
of 1
Sort By:
Ultramicroscopy
|
May 18, 2022
Data synchronization in operando gas and heating TEM
Fan Zhang, Merijn Pen, Ronald G Spruit, et al.
Ultramicroscopy
|
May 27, 2018
Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability
J Tijn van Omme, Marina Zakhozheva, Ronald G Spruit, et al.
Nanoscale
|
November 2, 2020
<i>In situ</i> electrochemistry inside a TEM with controlled mass transport
Anne France Beker, Hongyu Sun, Mathilde Lemang, et al.
Nature Communications
|
October 27, 2018
Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion
Leopoldo Molina-Luna, Shuai Wang, Yevheniy Pivak, et al.
ACS Applied Nano Materials
|
June 4, 2021
Mapping Elevated Temperatures with a Micrometer Resolution Using the Luminescence of Chemically Stable Upconversion Nanoparticles
Thomas P van Swieten, Tijn van Omme, Dave J van den Heuvel, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
May 18, 2022
Data synchronization in operando gas and heating TEM
Fan Zhang, Merijn Pen, Ronald G Spruit, et al.
Ultramicroscopy
|
May 27, 2018
Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability
J Tijn van Omme, Marina Zakhozheva, Ronald G Spruit, et al.
Nanoscale
|
November 2, 2020
<i>In situ</i> electrochemistry inside a TEM with controlled mass transport
Anne France Beker, Hongyu Sun, Mathilde Lemang, et al.
Nature Communications
|
October 27, 2018
Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion
Leopoldo Molina-Luna, Shuai Wang, Yevheniy Pivak, et al.
ACS Applied Nano Materials
|
June 4, 2021
Mapping Elevated Temperatures with a Micrometer Resolution Using the Luminescence of Chemically Stable Upconversion Nanoparticles
Thomas P van Swieten, Tijn van Omme, Dave J van den Heuvel, et al.
Page
of 1