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Rumyana V Petrova

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Journal of Electron Microscopy|October 17, 2006
A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samplesBo Yao, Rumyana V Petrova, Richard R Vanfleet, et al.
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Journal of Electron Microscopy|October 17, 2006
A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samplesBo Yao, Rumyana V Petrova, Richard R Vanfleet, et al.
Pageof 1