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Journal of Applied Crystallography|October 29, 2020
X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowiresArman Davtyan, Dominik Kriegner, Václav Holý, et al.Journal of Applied Crystallography|June 29, 2017
Threefold rotational symmetry in hexagonally shaped core-shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imagingArman Davtyan, Thilo Krause, Dominik Kriegner, et al.Pageof 2