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Ryan M White

Showing results (1-10 of 7) with videos related to

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Forensic Science International|March 10, 2015
Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)Ryan M White, Robert R Keller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2016
Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel PlateTaylor J Woehl, Ryan M White, Robert R Keller
Ultramicroscopy|October 23, 2020
Orientation mapping of graphene using 4D STEM-in-SEMBenjamin W Caplins, Jason D Holm, Ryan M White, et al.
Nanotechnology|March 21, 2019
Layer-by-layer thinning of MoS<sub>2</sub> via laser irradiationBien-Cuong Tran-Khac, Ryan M White, Frank W DelRio, et al.
Applied Surface Science|February 8, 2023
Surface chemistry in Ti-6Al-4V feedstock as influenced by powder reuse in electron beam additive manufacturingNicholas Derimow, Justin M Gorham, May L Martin, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
ACS Applied Materials & Interfaces|September 11, 2013
Airbrushed nickel nanoparticles for large-area growth of vertically aligned carbon nanofibers on metal (Al, Cu, Ti) surfacesMehmet F Sarac, Bryan D Anderson, Ryan C Pearce, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Forensic Science International|March 10, 2015
Restoration of firearm serial numbers with electron backscatter diffraction (EBSD)Ryan M White, Robert R Keller
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 7, 2016
Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel PlateTaylor J Woehl, Ryan M White, Robert R Keller
Ultramicroscopy|October 23, 2020
Orientation mapping of graphene using 4D STEM-in-SEMBenjamin W Caplins, Jason D Holm, Ryan M White, et al.
Nanotechnology|March 21, 2019
Layer-by-layer thinning of MoS<sub>2</sub> via laser irradiationBien-Cuong Tran-Khac, Ryan M White, Frank W DelRio, et al.
Applied Surface Science|February 8, 2023
Surface chemistry in Ti-6Al-4V feedstock as influenced by powder reuse in electron beam additive manufacturingNicholas Derimow, Justin M Gorham, May L Martin, et al.
Nanotechnology|June 22, 2016
Near-theoretical fracture strengths in native and oxidized silicon nanowiresFrank W DelRio, Ryan M White, Sergiy Krylyuk, et al.
ACS Applied Materials & Interfaces|September 11, 2013
Airbrushed nickel nanoparticles for large-area growth of vertically aligned carbon nanofibers on metal (Al, Cu, Ti) surfacesMehmet F Sarac, Bryan D Anderson, Ryan C Pearce, et al.
Pageof 1