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The Journal of Chemical Physics|July 25, 2023
mmodel: A workflow framework to accelerate the development of experimental simulationsPeter Sun, John A Marohn
Physical Review Letters|September 28, 2004
Microscopic view of charge injection in an organic semiconductorWilliam R Silveira, John A Marohn
The Journal of Chemical Physics|December 11, 2013
Electric force microscopy of semiconductors: theory of cantilever frequency fluctuations and noncontact frictionSwapna Lekkala, John A Marohn, Roger F Loring
Physical Review Letters|May 23, 2006
Dielectric fluctuations and the origins of noncontact frictionSeppe Kuehn, Roger F Loring, John A Marohn
The Journal of Physical Chemistry. B|June 23, 2007
Time-resolved electric force microscopy of charge trapping in polycrystalline pentaceneMichael Jaquith, Erik M Muller, John A Marohn
Physical Review. B, Condensed Matter and Materials Physics|February 14, 2014
A Unified Picture of Cantilever Frequency-Shift Measurements of Magnetic ResonanceSanggap Lee, Eric W Moore, John A Marohn
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|October 3, 2012
Rapid serial prototyping of magnet-tipped attonewton-sensitivity cantilevers by focused ion beam manipulationJonilyn G Longenecker, Eric W Moore, John A Marohn
The Journal of Physical Chemistry. B|July 28, 2006
Noncontact dielectric frictionSeppe Kuehn, John A Marohn, Roger F Loring
The Journal of Chemical Physics|February 13, 2008
Advances in mechanical detection of magnetic resonanceSeppe Kuehn, Steven A Hickman, John A Marohn
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