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Ryuji Nishi

Showing results (1-10 of 26) with videos related to

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Micron (Oxford, England : 1993)|September 26, 2017
Automatic system for electron tomography data collection in the ultra-high voltage electron microscopeMeng Cao, Ryuji Nishi, Fang Wang
Ultramicroscopy|February 26, 2018
Spherical aberration correction with an in-lens N-fold symmetric line currents modelShahedul Hoque, Hiroyuki Ito, Ryuji Nishi
Microscopy (Oxford, England)|January 11, 2023
Low-aberration ExB deflector optics for scanning electron microscopyMomoyo Enyama, Ryuji Nishi, Hiroyuki Ito, et al.
Ultramicroscopy|July 1, 2017
Axial geometrical aberration correction up to 5th order with N-SYLCShahedul Hoque, Hiroyuki Ito, Akio Takaoka, et al.
Micron (Oxford, England : 1993)|February 22, 2016
The influence of structure depth on image blurring of micrometres-thick specimens in MeV transmission electron imagingFang Wang, Ying Sun, Meng Cao, et al.
The Review of Scientific Instruments|March 5, 2009
Effect of sample structure on reconstruction quality in computed tomographyMeng Cao, Hai-Bo Zhang, Chao Li, et al.
Journal of Electron Microscopy|November 16, 2010
An automatic method of detecting and tracking fiducial markers for alignment in electron tomographyMeng Cao, Akio Takaoka, Hai-Bo Zhang, et al.
Nanotechnology|July 6, 2011
Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentationRyuji Nishi, Daisuke Miyagawa, Yoshihide Seino, et al.
Ultramicroscopy|December 3, 2015
Spherical aberration correction with threefold symmetric line currentsShahedul Hoque, Hiroyuki Ito, Ryuji Nishi, et al.
Microscopy (Oxford, England)|May 15, 2013
Structural modifications of dentinal microcracks with human agingMizuho Kubo, Jiro Miura, Takao Sakata, et al.
Pageof 3

Showing results (1-10 of 26) with videos related to

Sort By:
Pageof 3
Micron (Oxford, England : 1993)|September 26, 2017
Automatic system for electron tomography data collection in the ultra-high voltage electron microscopeMeng Cao, Ryuji Nishi, Fang Wang
Ultramicroscopy|February 26, 2018
Spherical aberration correction with an in-lens N-fold symmetric line currents modelShahedul Hoque, Hiroyuki Ito, Ryuji Nishi
Microscopy (Oxford, England)|January 11, 2023
Low-aberration ExB deflector optics for scanning electron microscopyMomoyo Enyama, Ryuji Nishi, Hiroyuki Ito, et al.
Ultramicroscopy|July 1, 2017
Axial geometrical aberration correction up to 5th order with N-SYLCShahedul Hoque, Hiroyuki Ito, Akio Takaoka, et al.
Micron (Oxford, England : 1993)|February 22, 2016
The influence of structure depth on image blurring of micrometres-thick specimens in MeV transmission electron imagingFang Wang, Ying Sun, Meng Cao, et al.
The Review of Scientific Instruments|March 5, 2009
Effect of sample structure on reconstruction quality in computed tomographyMeng Cao, Hai-Bo Zhang, Chao Li, et al.
Journal of Electron Microscopy|November 16, 2010
An automatic method of detecting and tracking fiducial markers for alignment in electron tomographyMeng Cao, Akio Takaoka, Hai-Bo Zhang, et al.
Nanotechnology|July 6, 2011
Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentationRyuji Nishi, Daisuke Miyagawa, Yoshihide Seino, et al.
Ultramicroscopy|December 3, 2015
Spherical aberration correction with threefold symmetric line currentsShahedul Hoque, Hiroyuki Ito, Ryuji Nishi, et al.
Microscopy (Oxford, England)|May 15, 2013
Structural modifications of dentinal microcracks with human agingMizuho Kubo, Jiro Miura, Takao Sakata, et al.
Pageof 3