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S Blaize

Showing results (1-10 of 7) with videos related to

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Optics Express|April 29, 2009
Enhanced light coupling in sub-wavelength single-mode silicon on insulator waveguidesC Pang, F Gesuele, A Bruyant, et al.
The Review of Scientific Instruments|September 7, 2010
Note: Multiscale scanning probe microscopyL Chassagne, S Blaize, P Ruaux, et al.
Nano Letters|May 13, 2016
Direct Observation of Optical Field Phase Carving in the Vicinity of Plasmonic MetasurfacesB Dagens, M Février, P Gogol, et al.
Journal of Microscopy|March 19, 2003
Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterizationS Blaize, S Aubert, A Bruyant, et al.
Nano Letters|February 19, 2013
Observation of near-field dipolar interactions involved in a metal nanoparticle chain waveguideA Apuzzo, M Février, R Salas-Montiel, et al.
The Review of Scientific Instruments|October 2, 2007
Enlarged atomic force microscopy scanning scope: novel sample-holder device with millimeter rangeA Sinno, P Ruaux, L Chassagne, et al.
Optics Express|June 18, 2009
Field localization and enhanced Second-Harmonic Generation in silicon-based microcavitiesE Descrovi, C Ricciardi, F Giorgis, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Optics Express|April 29, 2009
Enhanced light coupling in sub-wavelength single-mode silicon on insulator waveguidesC Pang, F Gesuele, A Bruyant, et al.
The Review of Scientific Instruments|September 7, 2010
Note: Multiscale scanning probe microscopyL Chassagne, S Blaize, P Ruaux, et al.
Nano Letters|May 13, 2016
Direct Observation of Optical Field Phase Carving in the Vicinity of Plasmonic MetasurfacesB Dagens, M Février, P Gogol, et al.
Journal of Microscopy|March 19, 2003
Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterizationS Blaize, S Aubert, A Bruyant, et al.
Nano Letters|February 19, 2013
Observation of near-field dipolar interactions involved in a metal nanoparticle chain waveguideA Apuzzo, M Février, R Salas-Montiel, et al.
The Review of Scientific Instruments|October 2, 2007
Enlarged atomic force microscopy scanning scope: novel sample-holder device with millimeter rangeA Sinno, P Ruaux, L Chassagne, et al.
Optics Express|June 18, 2009
Field localization and enhanced Second-Harmonic Generation in silicon-based microcavitiesE Descrovi, C Ricciardi, F Giorgis, et al.
Pageof 1