Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

S E Maccagnano-Zacher

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Physical Review Letters|February 1, 2008
Critical role of inelastic interactions in quantitative electron microscopyK A Mkhoyan, S E Maccagnano-Zacher, M G Thomas, et al.
Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.
Ultramicroscopy|April 1, 2008
Effects of amorphous layers on ADF-STEM imagingK A Mkhoyan, S E Maccagnano-Zacher, E J Kirkland, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Physical Review Letters|February 1, 2008
Critical role of inelastic interactions in quantitative electron microscopyK A Mkhoyan, S E Maccagnano-Zacher, M G Thomas, et al.
Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.
Ultramicroscopy|April 1, 2008
Effects of amorphous layers on ADF-STEM imagingK A Mkhoyan, S E Maccagnano-Zacher, E J Kirkland, et al.
Pageof 1