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Nanoscale|March 6, 2024
Revealing large room-temperature Nernst coefficients in 2D materials by first-principles modelingS Emad Rezaei, Peter SchindlerPhysical Review Materials|July 12, 2021
Thermomagnetic properties of Bi<sub>2</sub>Te<sub>3</sub> single crystal in the temperature range from 55 K to 380 KMd Sabbir Akhanda, S Emad Rezaei, Keivan Esfarjani, et al.Langmuir : the ACS Journal of Surfaces and Colloids|April 22, 2015
Enhanced Step Coverage of TiO₂ Deposited on High Aspect Ratio Surfaces by Plasma-Enhanced Atomic Layer DepositionPeter Schindler, Manca Logar, J Provine, et al.Advanced Materials (Deerfield Beach, Fla.)|September 12, 2021
Novel Ultrabright and Air-Stable Photocathodes Discovered from Machine Learning and Density Functional Theory Driven ScreeningEvan R Antoniuk, Peter Schindler, W Andreas Schroeder, et al.ACS Applied Materials & Interfaces|September 8, 2023
Electrolyte Coatings for High Adhesion Interfaces in Solid-State Batteries from First PrinciplesBrandi Ransom, Akash Ramdas, Eder Lomeli, et al.Journal of Midwifery & Women'S Health|August 12, 2017
The Process of Intrapartum Care Among Skilled Birth Attendants in the Dominican Republic and Maternal Perceptions of Care During Labor and Birth: A Case ReportPeter Schindler, Rosa Burgos, Kimberly Vuong, et al.Journal of Cardiac Failure|July 13, 2015
An economic evaluation of a self-care intervention in persons with heart failure and diabetesCarolyn Miller Reilly, Javed Butler, Steven D Culler, et al.ACS Applied Materials & Interfaces|June 14, 2016
Plasma-Enhanced Atomic Layer Deposition of SiN-AlN Composites for Ultra Low Wet Etch Rates in Hydrofluoric AcidYongmin Kim, J Provine, Stephen P Walch, et al.ACS Energy Letters|October 22, 2019
Surface Photovoltage-Induced Ultralow Work Function Material for Thermionic Energy ConvertersPeter Schindler, Daniel C Riley, Igor Bargatin, et al.ACS Applied Materials & Interfaces|February 2, 2019
Electrical Properties of Ultrathin Platinum Films by Plasma-Enhanced Atomic Layer DepositionHyo Jin K Kim, Kirsten E Kaplan, Peter Schindler, et al.Pageof 2