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Applied Optics
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April 15, 2010
Linnik interferometer: its use at short wavelengths
W Harris, S Mrowka, R J Speer
Applied Optics
|
March 15, 1985
Molybdenum-silicon multilayer mirrors for the extreme ultraviolet
T W Barbee, S Mrowka, M C Hettrick
Applied Optics
|
May 4, 2010
Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum
J Edelstein, M C Hettrick, S Mrowka, et al.
Applied Optics
|
May 1, 2010
Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering
J Edelstein, M C Hettrick, S Mrowka, et al.
Applied Optics
|
March 10, 2010
Grazing incidence interferometry: the use of the Linnik interferometer for testing image-forming reflection systems
R J Speer, M Chrisp, D Turner, et al.
Applied Optics
|
June 15, 1985
Extreme Ultraviolet Explorer spectrometer
M C Hettrick, S Bowyer, R F Malina, et al.
Optics Letters
|
October 27, 2009
Generation of a 45-ps-duration 15.5-nm x-ray laser
L B Da Silva, R A London, B J Macgowan, et al.
Applied Optics
|
March 8, 2008
Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-x-ray flat-field spectrograph
T Yamazaki, E Gullikson, N Miyata, et al.
Optics Letters
|
October 14, 2009
Power measurements of a saturated yttrium x-ray laser
L B Da Silva, B J Macgowan, S Mrowka, et al.
Science (New York, N.Y.)
|
July 22, 1994
Measurement of Laser-Plasma Electron Density with a Soft X-ray Laser Deflectometer
D Ress, L B Dasilva, R A London, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 14) with videos related to
Sort By:
Page
of 2
Applied Optics
|
April 15, 2010
Linnik interferometer: its use at short wavelengths
W Harris, S Mrowka, R J Speer
Applied Optics
|
March 15, 1985
Molybdenum-silicon multilayer mirrors for the extreme ultraviolet
T W Barbee, S Mrowka, M C Hettrick
Applied Optics
|
May 4, 2010
Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum
J Edelstein, M C Hettrick, S Mrowka, et al.
Applied Optics
|
May 1, 2010
Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering
J Edelstein, M C Hettrick, S Mrowka, et al.
Applied Optics
|
March 10, 2010
Grazing incidence interferometry: the use of the Linnik interferometer for testing image-forming reflection systems
R J Speer, M Chrisp, D Turner, et al.
Applied Optics
|
June 15, 1985
Extreme Ultraviolet Explorer spectrometer
M C Hettrick, S Bowyer, R F Malina, et al.
Optics Letters
|
October 27, 2009
Generation of a 45-ps-duration 15.5-nm x-ray laser
L B Da Silva, R A London, B J Macgowan, et al.
Applied Optics
|
March 8, 2008
Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-x-ray flat-field spectrograph
T Yamazaki, E Gullikson, N Miyata, et al.
Optics Letters
|
October 14, 2009
Power measurements of a saturated yttrium x-ray laser
L B Da Silva, B J Macgowan, S Mrowka, et al.
Science (New York, N.Y.)
|
July 22, 1994
Measurement of Laser-Plasma Electron Density with a Soft X-ray Laser Deflectometer
D Ress, L B Dasilva, R A London, et al.
Page
of 2