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Journal of Synchrotron Radiation
|
May 4, 2016
Single-crystal diamond refractive lens for focusing X-rays in two dimensions. Erratum
S Antipov, S V Baryshev, J E Butler, et al.
Journal of Synchrotron Radiation
|
December 25, 2015
Single-crystal diamond refractive lens for focusing X-rays in two dimensions
S Antipov, S V Baryshev, J E Butler, et al.
Rapid Communications in Mass Spectrometry : RCM
|
November 12, 2013
Dual-beam versus single-beam depth profiling: same sample in same instrument
S V Baryshev, N G Becker, A V Zinovev, et al.
Nanotechnology
|
December 11, 2012
Measuring the roughness of buried interfaces by sputter depth profiling
S V Baryshev, J A Klug, A V Zinovev, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Journal of Synchrotron Radiation
|
May 4, 2016
Single-crystal diamond refractive lens for focusing X-rays in two dimensions. Erratum
S Antipov, S V Baryshev, J E Butler, et al.
Journal of Synchrotron Radiation
|
December 25, 2015
Single-crystal diamond refractive lens for focusing X-rays in two dimensions
S Antipov, S V Baryshev, J E Butler, et al.
Rapid Communications in Mass Spectrometry : RCM
|
November 12, 2013
Dual-beam versus single-beam depth profiling: same sample in same instrument
S V Baryshev, N G Becker, A V Zinovev, et al.
Nanotechnology
|
December 11, 2012
Measuring the roughness of buried interfaces by sputter depth profiling
S V Baryshev, J A Klug, A V Zinovev, et al.
Page
of 1