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Samuel S Welborn

Showing results (1-10 of 4) with videos related to

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Journal of Synchrotron Radiation|June 26, 2024
TomoPyUI: a user-friendly tool for rapid tomography alignment and reconstructionSamuel S Welborn, Molleigh B Preefer, Johanna Nelson Weker
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 14, 2024
Streaming Large-Scale Microscopy Data to a Supercomputing FacilitySamuel S Welborn, Chris Harris, Stephanie M Ribet, et al.
ACS Applied Materials & Interfaces|March 4, 2021
Using X-Ray Scattering to Elucidate the Microstructural Instability of 3D Bicontinuous Nanoporous Metal Scaffolds for Use in an Aperiodic 3D Tricontinuous Conductor-Insulator-Conductor NanocapacitorSamuel S Welborn, Sven van der Meer, John S Corsi, et al.
ACS Applied Materials & Interfaces|September 8, 2021
Effect of Nanoscale Confinement on Polymer-Infiltrated Scaffold Metal CompositesShawn M Maguire, Connor R Bilchak, John S Corsi, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Journal of Synchrotron Radiation|June 26, 2024
TomoPyUI: a user-friendly tool for rapid tomography alignment and reconstructionSamuel S Welborn, Molleigh B Preefer, Johanna Nelson Weker
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 14, 2024
Streaming Large-Scale Microscopy Data to a Supercomputing FacilitySamuel S Welborn, Chris Harris, Stephanie M Ribet, et al.
ACS Applied Materials & Interfaces|March 4, 2021
Using X-Ray Scattering to Elucidate the Microstructural Instability of 3D Bicontinuous Nanoporous Metal Scaffolds for Use in an Aperiodic 3D Tricontinuous Conductor-Insulator-Conductor NanocapacitorSamuel S Welborn, Sven van der Meer, John S Corsi, et al.
ACS Applied Materials & Interfaces|September 8, 2021
Effect of Nanoscale Confinement on Polymer-Infiltrated Scaffold Metal CompositesShawn M Maguire, Connor R Bilchak, John S Corsi, et al.
Pageof 1