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The Journal of Chemical Physics|January 7, 2005
Damage induced by low-energy electrons in solid films of tetrahydrofuranS-P Breton, M Michaud, C Jäggle, et al.
Chemmedchem|December 31, 2013
A single subexcitation-energy electron can induce a double-strand break in DNA modified by platinum chemotherapeutic drugsMohammad Rezaee, Elahe Alizadeh, Pierre Cloutier, et al.
Journal of Medicinal Chemistry|April 28, 2021
High Cytotoxic Effect by Combining Copper-64 with a NOTA-Terpyridine Platinum ConjugateMeysam Khosravifarsani, Samia Ait-Mohand, Benoit Paquette, et al.
Plos One|July 18, 2018
Exploring an alternative explanation for the second phase of viral decay: Infection of short-lived cells in a drug-limited compartment during HAARTSteven Sanche, Thibault Mesplède, Nancy L Sheehan, et al.
Science (New York, N.Y.)|March 4, 2000
Resonant formation of DNA strand breaks by low-energy (3 to 20 eV) electronsB Boudaïffa, P Cloutier, D Hunting, et al.
Radiation Research|January 28, 2011
DNA damage induced by low-energy electrons: conversion of thymine to 5,6-dihydrothymine in the oligonucleotide trimer TpTpTYeunsoo Park, Zejun Li, Pierre Cloutier, et al.
The Journal of Physical Chemistry. B|July 21, 2012
Fundamental mechanisms of DNA radiosensitization: damage induced by low-energy electrons in brominated oligonucleotide trimersYeunsoo Park, Katarzyna Polska, Janusz Rak, et al.
The Journal of Physical Chemistry Letters|May 18, 2019
Clustered DNA Damage Induced by 2-20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell DeathYanfang Dong, Yingxia Gao, Wenhui Liu, et al.
The Journal of Physical Chemistry. B|April 3, 2020
Role of Transient Anions in Chemoradiation Therapy: Base Modifications, Cross-Links, and Cluster Damages Induced to Cisplatin-DNA Complexes by 1-20 eV ElectronsYanfang Dong, Yaxiao Wang, Puxiang Zhuang, et al.
The Journal of Physical Chemistry Letters|June 14, 2023
DNA Protection against Damages Induced by Low-Energy Electrons: Absolute Cross Sections for Arginine-DNA ComplexesXuran Wang, Hong Liao, Wenhui Liu, et al.
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