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Sander Konijnenberg

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Optics Express|February 25, 2018
Spatial coherence measurement and partially coherent diffractive imaging using self-referencing holographyYifeng Shao, Xingyuan Lu, Sander Konijnenberg, et al.
Optics Express|January 6, 2023
Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrologyTamar van Gardingen-Cromwijk, Manashee Adhikary, Christos Messinis, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Optics Express|February 25, 2018
Spatial coherence measurement and partially coherent diffractive imaging using self-referencing holographyYifeng Shao, Xingyuan Lu, Sander Konijnenberg, et al.
Optics Express|January 6, 2023
Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrologyTamar van Gardingen-Cromwijk, Manashee Adhikary, Christos Messinis, et al.
Pageof 1