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Scientific Reports|May 23, 2015
Location and Electronic Nature of Phosphorus in the Si Nanocrystal--SiO2 SystemDirk König, Sebastian Gutsch, Hubert Gnaser, et al.Scientific Reports|August 23, 2017
Boron-Incorporating Silicon Nanocrystals Embedded in SiO<sub>2</sub>: Absence of Free Carriers vs. B-Induced DefectsDaniel Hiller, Julian López-Vidrier, Sebastian Gutsch, et al.Nanotechnology|March 7, 2015
Dielectrophoretic investigation of Bi₂Te₃ nanowires-a microfabricated thermoelectric characterization platform for measuring the thermoelectric and structural properties of single nanowiresZhi Wang, Danny Kojda, Nicola Peranio, et al.Beilstein Journal of Nanotechnology|July 7, 2018
Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitrideDaniel Hiller, Julian López-Vidrier, Keita Nomoto, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 5, 2019
Electron Beam Effects on Oxide Thin Films-Structure and Electrical Property CorrelationsKrishna Kanth Neelisetty, Xiaoke Mu, Sebastian Gutsch, et al.Pageof 2