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Journal of Synchrotron Radiation|April 25, 2002
Plane-wave X-ray topography and its application at SPring-8Satoshi Iida, Yoshinori Chikaura, Seiji Kawado, et al.Journal of Synchrotron Radiation|June 24, 2004
Determination of the three-dimensional structure of dislocations in silicon by synchrotron white X-ray topography combined with a topo-tomographic techniqueSeiji Kawado, Toshinori Taishi, Satoshi Iida, et al.Pageof 1