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Serafin Delica

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Applied Optics|October 13, 2007
Wide-field depth-sectioning fluorescence microscopy using projector-generated patterned illuminationSerafin Delica, Carlo Mar Blanca
Optics Express|June 9, 2009
Spectral microthermography for component discrimination and hot spot identification in integrated circuitsGodofredo Bautista, Carlo Mar Blanca, Serafin Delica, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Applied Optics|October 13, 2007
Wide-field depth-sectioning fluorescence microscopy using projector-generated patterned illuminationSerafin Delica, Carlo Mar Blanca
Optics Express|June 9, 2009
Spectral microthermography for component discrimination and hot spot identification in integrated circuitsGodofredo Bautista, Carlo Mar Blanca, Serafin Delica, et al.
Pageof 1