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Plos One|July 1, 2025
SAMF-YOLO: A self-supervised, high-precision approach for defect detection in complex industrial environmentsJun Huang, Shamsul Arrieya Ariffin, Qiang Zhu, et al.
Scientific Reports|January 13, 2026
Contrastive learning enhanced MobileMamba for real time industrial defect detection on edge devicesJun Huang, Shamsul Arrieya Ariffin, Qun Yang, et al.
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