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IEEE Transactions on Pattern Analysis and Machine Intelligence
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December 22, 2023
BAL: Balancing Diversity and Novelty for Active Learning
Jingyao Li, Pengguang Chen, Shaozuo Yu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
June 11, 2024
MOODv2: Masked Image Modeling for Out-of-Distribution Detection
Jingyao Li, Pengguang Chen, Shaozuo Yu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
September 17, 2024
OOD-CV-v2 : An Extended Benchmark for Robustness to Out-of-Distribution Shifts of Individual Nuisances in Natural Images
Bingchen Zhao, Jiahao Wang, Wufei Ma, et al.
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Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
December 22, 2023
BAL: Balancing Diversity and Novelty for Active Learning
Jingyao Li, Pengguang Chen, Shaozuo Yu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
June 11, 2024
MOODv2: Masked Image Modeling for Out-of-Distribution Detection
Jingyao Li, Pengguang Chen, Shaozuo Yu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
September 17, 2024
OOD-CV-v2 : An Extended Benchmark for Robustness to Out-of-Distribution Shifts of Individual Nuisances in Natural Images
Bingchen Zhao, Jiahao Wang, Wufei Ma, et al.
Page
of 1