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Shaw C Feng

Showing results (1-10 of 6) with videos related to

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Journal of Manufacturing Systems|April 16, 2019
Scheduling Policies in Flexible Bernoulli Lines with Dedicated Finite Buffers<sup>☆</sup>Kyungsu Park, Jingshan Li, Shaw C Feng
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Software Architecture for a Virtual Environment for Nano Scale Assembly (VENSA)Yong-Gu Lee, Kevin W Lyons, Shaw C Feng
Journal of Research of the National Institute of Standards and Technology|August 10, 2016
Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force MicroscopyShaw C Feng, Che Bong Joung, Theodore V Vorburger
Journal of Computing and Information Science in Engineering|September 18, 2023
Additive Manufacturing In-situ and Ex-Situ Geometric Data RegistrationShaw C Feng, Yan Lu, Albert T Jones, et al.
Journal of Computing and Information Science in Engineering|October 3, 2017
Towards Knowledge Management for Smart ManufacturingShaw C Feng, William Z Bernstein, Thomas Hedberg, et al.
Scanning|January 18, 2008
Computational models of a nano probe tip for static behaviorsShaw C Feng, Theodore V Vorburger, Che Bong Joung, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Manufacturing Systems|April 16, 2019
Scheduling Policies in Flexible Bernoulli Lines with Dedicated Finite Buffers<sup>☆</sup>Kyungsu Park, Jingshan Li, Shaw C Feng
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Software Architecture for a Virtual Environment for Nano Scale Assembly (VENSA)Yong-Gu Lee, Kevin W Lyons, Shaw C Feng
Journal of Research of the National Institute of Standards and Technology|August 10, 2016
Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force MicroscopyShaw C Feng, Che Bong Joung, Theodore V Vorburger
Journal of Computing and Information Science in Engineering|September 18, 2023
Additive Manufacturing In-situ and Ex-Situ Geometric Data RegistrationShaw C Feng, Yan Lu, Albert T Jones, et al.
Journal of Computing and Information Science in Engineering|October 3, 2017
Towards Knowledge Management for Smart ManufacturingShaw C Feng, William Z Bernstein, Thomas Hedberg, et al.
Scanning|January 18, 2008
Computational models of a nano probe tip for static behaviorsShaw C Feng, Theodore V Vorburger, Che Bong Joung, et al.
Pageof 1