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ACS Combinatorial Science
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December 17, 2016
Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns
Efraín Hernández-Rivera, Shawn P Coleman, Mark A Tschopp
ACS Applied Materials & Interfaces
|
January 7, 2021
Microscopic and Macroscopic Characterization of Grain Boundary Energy and Strength in Silicon Carbide via Machine-Learning Techniques
Matthew Guziewski, David Montes de Oca Zapiain, Rémi Dingreville, et al.
ACS Applied Materials & Interfaces
|
January 19, 2018
Shear-Induced Brittle Failure along Grain Boundaries in Boron Carbide
Xiaokun Yang, Shawn P Coleman, Jerry C Lasalvia, et al.
Methodsx
|
October 27, 2018
Simulation of kinematic Kikuchi diffraction patterns from atomistic structures
Adam D Herron, Shawn P Coleman, Khanh Q Dang, et al.
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of 1
Search research articles
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Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
ACS Combinatorial Science
|
December 17, 2016
Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns
Efraín Hernández-Rivera, Shawn P Coleman, Mark A Tschopp
ACS Applied Materials & Interfaces
|
January 7, 2021
Microscopic and Macroscopic Characterization of Grain Boundary Energy and Strength in Silicon Carbide via Machine-Learning Techniques
Matthew Guziewski, David Montes de Oca Zapiain, Rémi Dingreville, et al.
ACS Applied Materials & Interfaces
|
January 19, 2018
Shear-Induced Brittle Failure along Grain Boundaries in Boron Carbide
Xiaokun Yang, Shawn P Coleman, Jerry C Lasalvia, et al.
Methodsx
|
October 27, 2018
Simulation of kinematic Kikuchi diffraction patterns from atomistic structures
Adam D Herron, Shawn P Coleman, Khanh Q Dang, et al.
Page
of 1